Support - Equipment


高分辨场发射扫描电子显微镜SEM
| number | JG-YQ014 |
| Specifications | |
| Manufacturer | Tescan |
| model | Tescan Clara |
| Manufacturing country | 捷克 |
| Classification number | 1 |
| Placement location | 郭可信材料表征中心 B309 |
| date of production | 2024-03-20 |
| Acquisition Date | 2023-08-20 |
| Network access date | 2024-05-20 |
information
reservation
| Main specifications and technical indicators | 分辨率: ≤0.9 nm @15 kV,≤1.3 nm @1kV |
| Main functions and features | 扫描电镜SEM:场发射扫描电镜Tescan CLARA具有较高分辦率(0.9 nm@15kV),能进行各种固态样品表面形貌的二次电子像、背散射电子像观察及图像处理,广泛用于金属材料、高分子材料、地质矿物、生物学等。本台电镜不仅在低电压下拥有极佳的分辨率(1.3 nm@1kV),而且能够通过选择二次电子和背散射电子的不同衬度,来探索样品可能包含的大量信息。 |
Main attachments and configurations |
牛津EDS和EBSD |


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