Support - Equipment

双球差校正透射电子显微镜TEM

number
Specifications
Manufacturer 赛默飞(FEI)
model Spectra Ultra
Manufacturing country 美国
Classification number 1
Placement location 郭可信材料表征中心
date of production 2023-08-24
Acquisition Date 2023-08-24
Network access date 1970-01-01

information

reservation
Main specifications and technical indicators

1、TEM信息分辨率:≤60 pm @300 kV,≤80 pm @200 kV, ≤100 pm @60 kV;
2、STEM分辨率: ≤50 pm @300 kV,≤70 pm @200 kV, ≤96 pm @60 kV;
3、一体化球差校正器:物镜球差校正器,最低优化校正到3阶像差以上、聚光镜球差校正器,最低优化校正到5阶像差以上;
4、高灵敏度16分割Panther STEM探头及HAADF探头。可采集BF、ABF、ADF、LAADF、HAADF以及DPC、iDPC信号;

Main functions and features

Spectra Ultra双球差校正透射电镜能在多种加速电压条件下对材料原子尺度结构成像与成分分析。电镜搭载双球差校正器、超级单色器、大面积能谱仪、K3直接电子相机能量损失谱仪等。同样适用于对电子束敏感材料进行快速、精确的微区结构及成分定量表征。

Main attachments and configurations

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