Support - Equipment


双球差校正透射电子显微镜TEM
| number | |
| Specifications | |
| Manufacturer | 赛默飞(FEI) |
| model | Spectra Ultra |
| Manufacturing country | 美国 |
| Classification number | 1 |
| Placement location | 郭可信材料表征中心 |
| date of production | 2023-08-24 |
| Acquisition Date | 2023-08-24 |
| Network access date | 1970-01-01 |
information
reservation
| Main specifications and technical indicators | 1、TEM信息分辨率:≤60 pm @300 kV,≤80 pm @200 kV, ≤100 pm @60 kV; |
| Main functions and features | Spectra Ultra双球差校正透射电镜能在多种加速电压条件下对材料原子尺度结构成像与成分分析。电镜搭载双球差校正器、超级单色器、大面积能谱仪、K3直接电子相机能量损失谱仪等。同样适用于对电子束敏感材料进行快速、精确的微区结构及成分定量表征。 |
Main attachments and configurations |
无 |


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